JEOL's Electron Microscopes Certified as Microscopy Heritage

JEOL Ltd. (Headquarters: Akishima, Tokyo; President and CEO: Izumi Oi) has had its scanning electron microscopes, the JSM-1 (completed in 1966) and JSM-2 (completed in 1967), certified as the third batch of 'Microscopy Heritage' by The Microscopy Society of Japan, a public interest incorporated association.

The 'Microscopy Heritage' certification was established by The Microscopy Society of Japan in 2024 to commemorate its 75th anniversary, aiming to preserve and pass on to future generations epoch-making technologies and products that have significantly contributed to the advancement of microscopy as cultural heritage.

Certified Name

Microscopy Heritage Certification No. 25

Pioneering Scanning Electron Microscopes in Japan: JSM-1 and JSM-2

Right: Dr. Jinya Jinna, President of The Microscopy Society of Japan

Certification Rationale

In 1966, JEOL launched the JSM-1, Japan's first commercially produced scanning electron microscope (SEM), just about six months after the world's first commercial SEM, the StereoScan by Cambridge Scientific Instruments. The JSM-1 achieved a resolution of 50 nm, incorporating an Everhart-Thornley (ET) detector for secondary electrons and a semiconductor detector for reflected electrons, and was also capable of observing Electron Beam Induced Current (EBIC) images. Its configuration closely resembles modern SEMs, reflecting the high aspirations of its developers. In 1967, JEOL further advanced the technology with the JSM-2, improving resolution from 50 nm to 25 nm to better observe fine structures. The JSM-2 added capabilities to observe transmission electron images, cathodoluminescence images, and X-ray images. The synergy between enhanced resolution and expanded functionality led to widespread adoption not only in cutting-edge academic research but also in R&D departments across industrial sectors such as materials, semiconductors, and life sciences. With the JSM-1, JEOL secured a leading position in the global SEM market, and with the JSM-2, it further demonstrated relentless innovation, significantly contributing to Japan's industrial competitiveness. At the time, the JSM-1 and JSM-2 were among the most advanced SEMs in the world, gaining traction both domestically and internationally. This achievement was groundbreaking during an era when Japanese products were often perceived abroad as low-cost and low-quality, marking a pivotal moment in establishing Japan's reputation as an industrial powerhouse.

JSM-1 and JSM-2

Related Information

The four engineers who led the development of the JSM-1 and JSM-2—Shizuo Kimoto, Hiroshi Hashimoto, Masayuki Sato, and Hideo Eguchi—were awarded the 16th Seto Prize by The Microscopy Society of Japan in 1971.

List of Recipients and Titles of The Microscopy Society of Japan Awards (Seto Prize)

In 2024, JEOL also received 'Microscopy Heritage' certification for two other instruments: the Magnetic Electron Microscope DA-1 Type (completed in 1947) and the Super Scope JEM-50B Type (completed in 1969).

Two Electron Microscopes Certified as 'Microscopy Heritage' by The Microscopy Society of Japan