Takano to Exhibit at JPCA Show 2026, June 10–12

Takano Co., Ltd. (Headquarters: Miyada Village, Nagano Prefecture; President and Representative Director: Masao Takano) will exhibit at JPCA Show 2026, to be held at Tokyo Big Sight from Wednesday, June 10, to Friday, June 12, 2026.

At this exhibition, the company will focus on its ALTAX (full-surface height inspection system) and showcase inspection equipment for packaging substrates, glass substrates, and wafer manufacturing processes.

In particular, the company will present its lineup of inspection systems that support glass core substrates and co-packaged optics, which are gaining attention as next-generation technologies, to meet a wide range of needs.

Event Overview: JPCA Show 2026 Dates: June 10 (Wed) – June 12 (Fri), 2026 Time: 10:00 – 17:00 (until 16:00 on the final day) Venue: Tokyo Big Sight, East Exhibition Hall Organizer: RX Japan Ltd. Booth Number: 3F-42

Official Website: https://www.jpcashow.com/show2026/ Visitor Pre-registration: https://f-vr.jp/jpca/jpca2026/

Exhibited Products: 1. 2D/3D Appearance Inspection System ALTAX-FS (Panel Exhibition) Capable of full-surface inspection for glass, wafers, and PKG substrates.

2. Full-Surface Height Inspection System for Wafers ALTAX-300EX (Panel Exhibition) The latest advanced model supporting micro-bumps.

Other Products: - Wafer Appearance Inspection System (Vi Series): High-precision inspection for wiring patterns, cracks, and foreign matter. - Wafer Surface Inspection System (WM+ Series): The latest model supporting nano-level particle detection. - Full-Surface Film Unevenness Inspection System (Thinspector): Enables full-surface inspection in a single scan. - Film Appearance Inspection System (Hawkeyes Series)